Universal Digital Quantum Simulation with Trapped Ions

Lanyon, B. P.; Hempel, C.; Nigg, D.; Müller, Markus; Gerritsma, R.; Zahringer, F.; Schindler, P.; Barreiro, J. T.; Rambach, M.; Kirchmair, G.; Hennrich, M.; Zoller, P.; Blatt, R.; Roos, C. F.

Washington, DC : American Association for the Advancement of Science (2011)
Journal Article

In: Science
Volume: 334
Issue: 6052
Page(s)/Article-Nr.: 57-61

Identifier