Single-Shot Measurement of Triplet-Singlet Relaxation in a Si/SiGe Double Quantum Dot

Prance, J. R.; Shi, Zhan; Simmons, C. B.; Savage, D. E.; Lagally, M. G.; Schreiber, Lars R.; Vandersypen, L. M. K.; Friesen, Mark; Joynt, Robert; Coppersmith, S. N.; Eriksson, M. A.

Ridge, NY : APS, American Physical Society (2012)
Journal Article

In: Physical review letters : PRL
Volume: 108
Page(s)/Article-Nr.: 046808

Identifier