Assessing the Progress of Trapped-Ion Processors Towards Fault-Tolerant Quantum Computation

Bermudez, A.; Xu, X.; Nigmatullin, R.; O’Gorman, J.; Negnevitsky, V.; Schindler, P.; Monz, T.; Poschinger, U. G.; Hempel, C.; Home, J.; Schmidt-Kaler, F.; Biercuk, M.; Blatt, R.; Benjamin, S.; Müller, Markus

College Park, Md : APS (2017)
Journal Article

In: Physical review / X
Volume: 7
Issue: 4
Page(s)/Article-Nr.: 041061

Identifier